ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,258, issued on May 13, was assigned to Siemens AG (Munich).
"Systems and methods for automated x-ray inspection" was invented by Jochen Bonig (Nuremberg, Germany) and Konstantin Schmidt (Nuremberg, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method of automated X-ray inspection during the production of printed circuit board, PCB, assemblies. The method includes capturing an X-ray image of a PCB assembly, determining a first error indicator based on image processing of the captured X-ray image, determining, in case the first error indicator indicates the PCB assembly as faulty, a second error indicator based on the c...