ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,493, issued on June 24, was assigned to Siemens AG (Munich).
"Centralized analytics of multiple visual inspection appliances" was invented by Yonatan Hyatt (Tel-Aviv, Israel) and Harel Boren (Givat Shmuel, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A visual inspection data collection and analysis system comprising: a plurality of visual inspection appliances (VTA) configured to inspect and acquire visual inspection data relating to inspected items; and a data collection and analytics server (DCAS) configured to receive information comprising the visual inspection data from the multiple VIAs and to analyze the received information to form ...