US Patent Issued to Siemens on June 17 for "Self-supervised anomaly detection framework for visual quality inspection in manufactruing" (Canadian, American Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,703, issued on June 17, was assigned to Siemens AG (Munich).

"Self-supervised anomaly detection framework for visual quality inspection in manufactruing" was invented by Baris Erol (Rochester Hills, Mich.) and Jason Dube (Windsor, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "An AI-based method for visual inspection of parts manufactured on a shop floor includes acquiring a set of real images of nominal parts manufactured on the shop floor to create training datasets. A self-supervised pre-trainer module is used to pre-train a loss computation neural network in a self-supervised learning process using a first dataset on pretexts defined by r...