ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,394,037, issued on Aug. 19, was assigned to Siemens AG (Munich).
"Physics-informed anomaly detection in formed metal parts" was invented by Baris Erol (Rochester Hills, Mich.), Jason Dube (Windsor, Canada) and Yuan Zi (Houston).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defects in a formed metal part includes locating one or more regions of interest in a synthetic image of a part manufactured by a forming process. The synthetic image is informed based on a physics-based simulation of the forming process. The regions of interest indicate a high risk of having a defect from the forming process. A set of training images including ...