US Patent Issued to Siemens Medical Solutions USA, Northwestern University on Jan. 13 for "Solid-state detector characterization by machine learning-based physical model with reduced defect levels" (Illinois Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,666, issued on Jan. 13, was assigned to Siemens Medical Solutions USA Inc. (Malvern, Pa.) and Northwestern University (Evanston, Ill.).

"Solid-state detector characterization by machine learning-based physical model with reduced defect levels" was invented by Srutarshi Banerjee (Chicago), Miesher Rodrigues (Buffalo Grove, Ill.), Alexander Hans Vija (Evanston, Ill.) and Aggelos Katsaggelos (Chicago).

According to the abstract* released by the U.S. Patent & Trademark Office: "A physics-based network model is trained to learn weights such as trapping, detrapping, and/or transport of holes and/or electrons, as well as voltage distribution on a voxel-by-voxel basis throughout a solid-...