ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,452,148, issued on Oct. 21, was assigned to Siemens Industry Software Inc. (Plano, Texas).

"Method of determining a bit length of an IQ sample" was invented by Jaakko Kaikkonen (Oulu, Finland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining a bit length of an IQ sample associated with a first data frame is provided. The method includes determining a first parameter associated with a payload length of the first data frame, and determining a second parameter indicative of a number of physical resource blocks in the first data frame. A presence of a compression header is detected based on the first parameter and the second parameter, ...