US Patent Issued to Siemens Industry Software on May 13 for "Edge center point-based characterization of semiconductor layout designs" (Egyptian Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,299,951, issued on May 13, was assigned to Siemens Industry Software Inc. (Plano, Texas).

"Edge center point-based characterization of semiconductor layout designs" was invented by Hazem Hegazy (Cairo), Ahmed Hamed-Fatehy (Giza, Egypt), Sara Khalaf (Cairo) and Omar ElSewefy (Giza, Egypt).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computing system implementing a physical verification tool can identify edges of a geometric pattern located within a search area surrounding a point of interest in a semiconductor layout design, characterize the edges of the geometric pattern based on locations of center points of the edges from the point of interest with...