US Patent Issued to Siemens Industry Software on Dec. 30 for "Defect diagnosis with dynamic root cause detection" (Oregon Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,465, issued on Dec. 30, was assigned to Siemens Industry Software Inc. (Plano, Texas).

"Defect diagnosis with dynamic root cause detection" was invented by Xiaoyuan Qi (Portland, Ore.), Fan Jiang (Beaverton, Ore.), Gaurav Veda (Hillsboro, Ore.), Manish Sharma (Wilsonville, Ore.) and Wu-Tung Cheng (Lake Oswego, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application discloses a computing system to identify suspected defects in a manufactured integrated circuit, which correspond to electrical failures detected by a test applied to the manufactured integrated circuit. The computing system can utilize the suspected defects in the manufactur...