US Patent Issued to SIEMENS HEALTHINEERS on Oct. 21 for "Selection of frequency offset for an MRI scan" (German Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,450,745, issued on Oct. 21, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).

"Selection of frequency offset for an MRI scan" was invented by Seung Su Yoon (Erlangen, Germany), Jens Wetzl (Erlangen, Germany), Fasil Gadjimuradov (Erlangen, Germany) and Michaela Schmidt (Uttenreuth, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A frequency offset is selected based on similarity measures of multiple MRI images obtained from frequency scout measurements associated with multiple frequency offsets from a reference frequency of a magnetization excitation pulse. The similarity measure for each respective MRI image of the multiple MRI images...