ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,693, issued on May 27, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).
"Extra-focal beam aperture device for an x-ray emitter" was invented by Anja Fritzler (Erlangen, Germany), Petra Maurer (Heroldsbach, Germany), Peter Geithner (Erlangen, Germany) and Christoph Jud (Nuremberg, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "One or more example embodiments relates to an extra-focal beam aperture device for an X-ray emitter and to the X-ray emitter. The extra-focal beam aperture device according to one or more example embodiments for an X-ray emitter has a planar beam-shaping element including an X-ray opaque material, the plana...