US Patent Issued to Siemens Healthineers on May 27 for "Avoidance of artifacts in measurement data captured using a magnetic resonance system" (German Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,717, issued on May 27, was assigned to Siemens Healthineers AG (Forchheim, Germany).

"Avoidance of artifacts in measurement data captured using a magnetic resonance system" was invented by Adam Kettinger (Erlangen, Germany), Flavio Carinci (Wurzburg, Germany), Miriam Van De Stadt-Lagemaat (Erlangen, Germany), Mario Zeller (Erlangen, Germany) and Dominik Paul (Bubenreuth, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for avoiding artifacts in measurement data captured using a magnetic resonance system which has a gradient unit. The method includes loading data which characterizes the gradient unit of the magnetic resonance system; l...