ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,383,210, issued on Aug. 12, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).
"Method and system for controlling an FFS X-ray system" was invented by Marcus Radicke (Veitsbronn, Germany), Ralf Nanke (Neunkirchen am Brand, Germany), Steffen Kappler (Effeltrich, Germany), Thomas Weber (Hausen, Germany), Ferdinand Lueck (Erlangen, Germany), Ludwig Ritschl (Buttenheim, Germany) and Anja Fritzler (Erlangen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for controlling an FFS X-ray system comprises: simulating a beam geometry of the X-ray beam at a specified FFS deflection onto the detector during recording of a projection image;...