US Patent Issued to SIEMENS HEALTHINEERS INTERNATIONAL on Oct. 7 for "Estimating scatter in X-ray images caused by imaging system components using kernels based on beam hardening" (Swiss Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,433,552, issued on Oct. 7, was assigned to SIEMENS HEALTHINEERS INTERNATIONAL AG (Switzerland).

"Estimating scatter in X-ray images caused by imaging system components using kernels based on beam hardening" was invented by Mathieu Plamondon (Glattbrugg, Switzerland), Balazs Nagy (Schlieren, Switzerland), Mathias Lehmann (Zurich, Switzerland), Adam Michal Strzelecki (Daettwil, Switzerland), Igor Peterlik (Kuenten, Switzerland) and Dieter Marc Seghers (Zurich, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method of reducing scatter in an X-ray projection image of an object, the method comprising: generating an initial X-...