US Patent Issued to SIEMENS HEALTHINEERS INTERNATIONAL on March 25 for "Estimating scatter in X-ray images caused by imaging system components using spatially-dependent kernels" (Swiss Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,088, issued on March 25, was assigned to SIEMENS HEALTHINEERS INTERNATIONAL AG (Switzerland).

"Estimating scatter in X-ray images caused by imaging system components using spatially-dependent kernels" was invented by Mathieu Plamondon (Glattbrugg, Switzerland), Balazs Nagy (Schlieren, Switzerland), Mathias Lehmann (Zurich, Switzerland), Adam Michal Strzelecki (Daettwil, Switzerland), Igor Peterlik (Kuenten AG, Switzerland) and Dieter Marc Seghers (Zurich, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method of reducing scatter in an X-ray projection image of an object comprises: generating an initial X-ray projec...