US Patent Issued to Siemens Healthcare, Stichting Radboud Universiteit on June 24 for "Method and system for simultaneous mapping of quantitative MRI parameters using a T2 prepared inversion" (Swiss, Dutch Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,336,802, issued on June 24, was assigned to Siemens Healthcare GmbH (Erlangen, Germany) and Stichting Radboud Universiteit (Nijmegen, Netherlands).

"Method and system for simultaneous mapping of quantitative MRI parameters using a T2 prepared inversion" was invented by Gabriele Bonanno (Bern, Switzerland), Jose Pedro Marques (Nijmegen, Netherlands), Tobias Kober (Lausanne, Switzerland) and Tom Hilbert (Lausanne, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A qMRI system and method map qMRI parameters of a biological object. The method includes performing, by the qMRI system, N scans wherein each scan, includes: performing T2-prepared inver...