ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,768, issued on June 3, was assigned to SHINKO ELECTRIC INDUSTRIES Co. LTD. (Nagano, Japan).

"Measuring device and measuring system" was invented by Atsuto Yoda (Nagano, Japan) and Takuya Horiuchi (Nagano, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring device includes a substrate having a first surface and a second surface on an opposite side from the first surface, a first electrode and a second electrode provided on the substrate, a heat-sensitive portion, provided on the first surface, and configured to detect heat of a substance that makes contact with the first surface, a temperature sensor provided on the second surface, and a ...