ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,461, issued on Sept. 30, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Defect detection device and defect detection method" was invented by Masuto Kitamura (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An exciter (11, 12) induces an elastic wave in a test object by sequentially giving the object multiple kinds of vibrations having different frequencies. An illuminator (13, 14) performs stroboscopic illumination on a measurement area on the surface of the object. A displacement measurer (15) controls the timing of the stroboscopic illumination with respect to the phase of the elastic wave for each kind of vibration to perform a batc...