ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,121, issued on Oct. 7, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"X-ray fluorescence analysis device" was invented by Yuta Saito (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an X-ray fluorescence analyzer capable of performing an analysis under more favorable conditions depending on an analysis target. The X-ray fluorescence analyzer includes a detector 30, preamplifiers 41A, 41B configured to amplify a detection signal from the detector into a staircase wave signal at different signal amplification factors GA, GB, a differentiating circuit 42 configured to convert the staircase wave signal into a differential wave si...