US Patent Issued to SHIMADZU on Oct. 14 for "Stress measuring method, stress measuring apparatus, and computer readable non-transitory storage medium" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,737, issued on Oct. 14, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Stress measuring method, stress measuring apparatus, and computer readable non-transitory storage medium" was invented by Kuniaki Kanamaru (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Creating a calibration curve representing a relationship between a luminescence intensity of stress luminescence and a stress includes: forming a second stress luminescent film on a surface of a test piece; applying external force to the test piece; detecting external force to be applied to the test piece; photographing the test piece under application of external force; creating a ...