ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,881, issued on Nov. 25, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Raman spectroscopy analysis method and microscopic Raman spectroscopy device" was invented by Kohei Hirono (Kyoto, Japan) and Yusuke Aoi (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "[Problem to be solved] An object of the present invention is to provide a Raman spectroscopy analysis method that identifies the number of irradiation times of laser light at which a sample to be analyzed is damaged by the laser light during multiple Raman spectroscopy measurements and performs structural analysis of the sample to be analyzed using data on Raman scattering light obtai...