US Patent Issued to SHIMADZU on Nov. 25 for "Defect inspection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,086, issued on Nov. 25, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Defect inspection apparatus" was invented by Naoto Mishina (Kyoto, Japan), Hirofumi Okamoto (Kyoto, Japan), Takashi Tanaka (Kyoto, Japan), Satoru Sugimoto (Kyoto, Japan), Masashi Hayakawa (Kyoto, Japan), Takahide Hatahori (Kyoto, Japan) and Hiroshi Horikawa (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect inspection apparatus (100) includes an imager (image sensor 35) configured to image an inspection target 7, and a display (6) configured to display an image based on an image captured by the imager. The defect inspection apparatus (100) also includes a cont...