ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,309, issued on Nov. 18, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Waveform analytical method and waveform analytical device" was invented by Shinji Kanazawa (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A waveform analytical device 4 which analyzes a target waveform which is a chromatogram or an optical spectrum includes a waveform division unit 54 configured to divide the target waveform into a plurality of partial waveforms, a determination unit 55 configured to determine whether each of the plurality of partial waveforms of the target waveform is a peak portion using a learned model created by machine learning using a plurali...