ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,884, issued on Nov. 11, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"X-ray imaging system and x-ray image analysis method" was invented by Ryuji Sawada (Kyoto, Japan), Hitomi Yoshiyama (Kyoto, Japan) and Hiroaki Tsushima (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an X-ray imaging, first and second images of X-ray images corresponding to different emission angles are generated. In the X-ray imaging system, based on positions of a target part included in an inspection target in the first and second images, and an angle difference between the emission angles of X-rays that are emitted to generate the first and second images, a t...