ALEXANDRIA, Va., June 10 -- United States Patent no. 12,292,397, issued on May 6, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"X-ray fluorescence analyzer" was invented by Yuji Morihisa (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an X-ray fluorescence analyzer capable of reducing consumption of a gas constituting a measurement atmosphere. The X-ray fluorescence analyzer is provided with a sample chamber configured to place a sample therein, a measurement chamber arranged adjacent to the sample in the sample chamber, an X-ray tube configured to irradiate the sample with X-rays, and a detector configured to detect the X-rays reflected by the sample. The detector is provided with...