US Patent Issued to SHIMADZU on May 20 for "Sample measurement device and measurement sample identification method" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,150, issued on May 20, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Sample measurement device and measurement sample identification method" was invented by Satoru Watanabe (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measurement device (100) includes a measurement unit (10) configured to measure a sample containing a plurality of components according to a measurement condition (30) including a plurality of parameters (31), and a data processing unit (20) configured to acquire measurement data, and the data processing unit is configured to acquire a distribution (43) of a measurement quality indicator (42) according to the...