ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,145, issued on May 20, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Inspection apparatus" was invented by Akio Imai (Tsukuba, Japan) and Takayuki Sato (Tsukuba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus comprises a first channel that passes an aqueous sample therethrough, a second channel that passes a phosphate eluent therethrough, a separation device that separates by size a group of substances contained in the aqueous sample, and a TOC device that oxidizes each substance separated by the separation device by size and measures organic carbon contained in each substance. The separation device includes a column ...