US Patent Issued to SHIMADZU on May 13 for "Sample measurement device and measurement parameter setting assistance device" (Japanese Inventor)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,285, issued on May 13, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Sample measurement device and measurement parameter setting assistance device" was invented by Akira Noda (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measurement device includes a measurement unit (1) configured to measure a sample, and a controller (2) configured to analyze a measurement result of the measurement unit. The controller (2) is configured to estimate and acquire a measurement result under another measurement condition using a model formula based on measurement results under a plurality of measurement conditions with different measurement pa...