US Patent Issued to SHIMADZU on July 8 for "Scanning probe microscope and method for measuring physical quantity using scanning probe microscope" (Japanese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,779, issued on July 8, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Scanning probe microscope and method for measuring physical quantity using scanning probe microscope" was invented by Kenji Yamasaki (Kyoto, Japan) and Akinori Kogure (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scanning probe microscope (50) is provided with a probe (20), a cantilever (2) supporting the probe (20), a scanner (43) on which a sample (S) is placed, a drive unit (4) for changing the distance between the sample (S) and the probe (20), and a displacement measurement unit (3) for measuring the displacement of the cantilever (2). The scanning probe micr...