ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,428, issued on Jan. 20, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Analysis method and diagnosis assistance method" was invented by Yuichiro Fujita (Kyoto, Japan), Akira Noda (Kyoto, Japan), Yusuke Tamai (Kyoto, Japan) and Yoshihiro Yamada (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis method for analyzing a sample includes a first step of acquiring measurement data including a first signal based on the sample and a second signal based on noise added to the first signal as a result of analysis of the sample, a second step of assuming a shape representing the first signal and a shape representing the second signal and m...