ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,623, issued on Jan. 13, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"X-ray fluorescence analyzer and x-ray aperture member" was invented by Goshi Akiyama (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An aperture member narrows an irradiation range of primary X-rays generated by an X-ray tube. The analysis unit analyzes fluorescent X-rays generated from a sample when the sample is irradiated with the primary X-rays that have passed through the aperture member. The aperture member includes a first opening formed on an incident side of the primary X-rays, a second opening formed on an emission side of the primary X-rays, and a hole fo...