US Patent Issued to SHIMADZU on Jan. 13 for "X-ray analyzer with movable slit between sample and analyzing crystal" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,622, issued on Jan. 13, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"X-ray analyzer with movable slit between sample and analyzing crystal" was invented by Keijiro Suzuki (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray analyzer is provided with an excitation source configured to irradiate a sample with an excitation beam, an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam for each wavelength, a line detector having a plurality of detection elements each arranged to detect an intensity of each of the plurality of wavelengths diffracted by the analyzing...