ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,526, issued on Dec. 30, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Inspection apparatus and inspection method" was invented by Masahito Yahata (Kyoto, Japan), Kazuma Maeda (Kyoto, Japan), Tatsuya Kataoka (Kyoto, Japan), Yuichi Masuda (Kyoto, Japan), Nobuhiro Namikawa (Kyoto, Japan), Akioki Nakamori (Kyoto, Japan) and Tatsuya Iwama (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a measurement unit, a flow-in tube for flow of sample water into the measurement unit, a connection portion that connects a sample tube and the measurement unit to each other, a liquid sending portion that sends sample water ...