US Patent Issued to SHIMADZU on Dec. 16 for "Management device for material testing machine by acquiring captured image of a control device, management system and management method thereof" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,330, issued on Dec. 16, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Management device for material testing machine by acquiring captured image of a control device, management system and management method thereof" was invented by Daisuke Hagihara (Kyoto, Japan), Taiki Nishimura (Kyoto, Japan), Tohru Matsuura (Kyoto, Japan) and Shota Maki (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "This management device for a material testing machine includes: an acquisition unit that acquires at least either a captured image of a material testing machine body or a captured image of a control device that causes the material testing machine body t...