US Patent Issued to SHIMADZU on Dec. 16 for "Defect detection device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,529, issued on Dec. 16, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Defect detection device" was invented by Naoto Mishina (Kyoto, Japan), Hiroshi Horikawa (Kyoto, Japan) and Satoru Sugimoto (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection device includes: an excitation unit configured to apply vibration to an inspection object; a vibration state image creation unit configured to measure by an optical means a vibration state in a measurement area on a surface of the inspection object to which the vibration is applied, and to create one or more types of vibration state images representing the vibration state in the ...