ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,855, issued on Aug. 12, was assigned to Shimadzu Corp. (Kyoto, Japan).

"X-ray imaging system and learned model production method" was invented by Hiroaki Tsushima (Kyoto, Japan) and Ryuji Sawada (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray imaging system is configured to acquire first and second images from a teacher X-ray image including an inspection target. Discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part is acquired. Machine learning for producing a learned model is performed by using input teacher data sets based on t...