ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,715, issued on May 20, was assigned to SHENZHEN YINWANG INTELLIGENT TECHNOLOGIES Co. LTD. (Shenzhen, China).
"Parameter calibration method and apparatus" was invented by Yilun Chen (Shenzhen, China) and Han Li (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "This application provides a parameter calibration method and apparatus, which may be applied to calibration of an intrinsic parameter and an extrinsic parameter of an image shooting device. According to the method and apparatus, with a position of a calibration pattern fixed, a position and an angle of the image shooting device relative to the calibration pattern are accurately ad...