ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,236, issued on Feb. 4, was assigned to SHENZHEN XPECTVISIONTECHNOLOGY Co. LTD. (Shenzhen, China).
"Apparatuses for radiation detection and methods of making them" was invented by Yurun Liu (Shenzhen, China) and Peiyan Cao (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are apparatuses for detecting radiation and methods of making them. The method comprises forming a recess into a semiconductor substrate, wherein a portion of the semiconductor substrate extends into the recess and is surrounded by the recess; depositing semiconductor nanocrystals into the recess, the semiconductor nanocrystals having a different compos...