ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,118, issued on May 20, was assigned to SHENZHEN XPECTVISION TECHNOLOGY Co. LTD. (Shenzhen, China).

"Backscatter X-ray system" was invented by Peiyan Cao (Shenzhen, China) and Yurun Liu (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a backscatter X-ray system comprising: an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object; a sensor configured to differentiate backscattered X-ray from different spots along the line."

The patent was filed on April 21, 2021, under Application No. 17/236,486.

*For further information, includ...