ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,261, issued on Aug. 5, was assigned to Shenzhen TOPOS Sensor Technology Co. LTD. (Shenzhen, China).
"Temperature measurement circuit structure and temperature probe" was invented by Zhaoting Zeng (Shenzhen, China) and Jinkun He (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature measurement circuit structure and a temperature probe are provided. The temperature measurement circuit structure includes a first temperature measurement circuit, a second temperature measurement circuit, a charging module, and a switching circuit, the switching circuit is connected to the charging module; a third wire and a fourth wire of the secon...