US Patent Issued to SHENZHEN MICROBT ELECTRONICS TECHNOLOGY on Nov. 18 for "Test circuit, test method, and computing system comprising test circuit for testing sequential circuit in pipeline stage" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,404, issued on Nov. 18, was assigned to SHENZHEN MICROBT ELECTRONICS TECHNOLOGY Co. LTD. (Guangdong, China).

"Test circuit, test method, and computing system comprising test circuit for testing sequential circuit in pipeline stage" was invented by Mo Chen (Guangdong, China), Zhijun Fan (Guangdong, China), Jianbo Liu (Guangdong, China) and Chao Xu (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit (300, 300', 400, 500, 600, 700, 800), including: a test sequence providing module (301), configured to provide a test sequence (PRBS) to a to-be-tested sequential device (303); a clock driving module (307, 407, 507, 607, 707, 80...