US Patent Issued to SHANGHAI UNITED IMAGING MICROELECTRONICS TECHNOLOGY on Oct. 7 for "Voltage calibration devices, methods and imaging systems including thereof" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,433,563, issued on Oct. 7, was assigned to SHANGHAI UNITED IMAGING MICROELECTRONICS TECHNOLOGY Co. LTD. (Shanghai).

"Voltage calibration devices, methods and imaging systems including thereof" was invented by Chengzhi Li (Shanghai), Qingzhong Zhao (Shanghai), Jianguo Diao (Shanghai), Zhigang Li (Shanghai), Yue Liu (Shanghai) and Longzi Yang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a voltage calibration device, method and imaging system. The voltage calibration device, comprising: a channel selector and a calibration unit, wherein an input end of the channel selector is selectively connected to channels to b...