US Patent Issued to Shanghai United Imaging Intelligence on Oct. 7 for "Systems and methods for determining anatomical deformations" (American, French Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,401, issued on Oct. 7, was assigned to Shanghai United Imaging Intelligence Co. Ltd. (Shanghai).

"Systems and methods for determining anatomical deformations" was invented by Benjamin Planche (Briarwood, N.Y.), Pierre Sibut-Bourde (Gex, France), Ziyan Wu (Lexington, Mass.), Meng Zheng (Cambridge, Mass.), Zhongpai Gao (Rowley, Mass.) and Abhishek Sharma (Boston).

According to the abstract* released by the U.S. Patent & Trademark Office: "The physical characteristics of one or more anatomical structures of a person may change in accordance with conditions surrounding the determination of such physical characteristics. Machine learning based techniques may be used to determine a temp...