ALEXANDRIA, Va., Aug. 6 -- United States Patent no. D1,087,381, issued on Aug. 5, was assigned to SHANGHAI TOSUN TECHNOLOGY LTD. (Shanghai).
"Testing device" was invented by Mang Mo (Shanghai), Yueyin Xie (Shanghai) and Chu Liu (Shanghai).
The patent was filed on May 27, 2024, under Application No. D/944,171.
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