US Patent Issued to SHANGHAI PERCIPIO TECHNOLOGY on Nov. 11 for "Depth data measuring device and structured light projection unit" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,744, issued on Nov. 11, was assigned to SHANGHAI PERCIPIO TECHNOLOGY Ltd. (Shanghai).

"Depth data measuring device and structured light projection unit" was invented by Minjie Wang (Shanghai) and Yushi Liang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a depth data measuring device comprising a structured light projection unit and an imaging unit. The projection unit includes a laser generator and an LCOS (Liquid Crystal on Silicon) element for generating structured light to illuminate a subject. The LCOS enables fine projection and supports various patterns (e.g., speckles, stripes), enhancing depth imaging accuracy across ...