US Patent Issued to SHANGHAI JIAO TONG UNIVERSITY on Oct. 7 for "Methods and systems of scanning microwave vibration and deformation measurement" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,259, issued on Oct. 7, was assigned to SHANGHAI JIAO TONG UNIVERSITY (Shanghai).

"Methods and systems of scanning microwave vibration and deformation measurement" was invented by Yuyong Xiong (Shanghai) and Zhike Peng (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scanning method and system for measuring microwave vibration and deformation include simultaneously transmitting linear-frequency-modulation continuous waves by using a plurality of transmit antennas and enabling a main lobe of a synthesized beam to be directed towards a specific angle direction; receiving echoes by using a plurality of receive antennas to obtain vibration and d...