US Patent Issued to Shanghai Jiao Tong University on Dec. 2 for "Calibration system and method for integrated optical phased array chip" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,336, issued on Dec. 2, was assigned to Shanghai Jiao Tong University (Shanghai).

"Calibration system and method for integrated optical phased array chip" was invented by Liangjun Lu (Shanghai), Weihan Xu (Shanghai), Linjie Zhou (Shanghai), Jianping Chen (Shanghai) and Jiao Liu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A calibration system and related methods for optical phased array chips. The calibration system includes an adjustable mount module, an infrared microscopic observation module, an arrayed driver module, a two-dimensional laser beam scanning module, a photoelectric conversion module and an upper computer, and utilizes comp...