US Patent Issued to Shanghai Institute of Technical Physics, Chinese Academy of Sciences on Oct. 28 for "Solar reflection full-band hyperspectral imaging detection system" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,192, issued on Oct. 28, was assigned to Shanghai Institute of Technical Physics, Chinese Academy of Sciences (Shanghai).

"Solar reflection full-band hyperspectral imaging detection system" was invented by Yinnian Liu (Shanghai), Zongcun Zhang (Shanghai), Rongjie Qin (Shanghai), Dexin Sun (Shanghai), Yun Zhao (Shanghai) and Youlong Ke (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A solar reflection full-band hyperspectral imaging detection system comprises a telescope light collection system, a field-of-view separation assembly, a spectrometer assembly, and a detector assembly. The field-of-view separation assembly comprises an integrated ...