US Patent Issued to SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES on July 1 for "Real-time spectrum testing device for volatile condensable material in wide temperature range and testing method" (Chinese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,630, issued on July 1, was assigned to SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES (Shanghai).

"Real-time spectrum testing device for volatile condensable material in wide temperature range and testing method" was invented by Liwei Sun (Shanghai), Lei Ding (Shanghai), Libing Li (Shanghai), Enguang Liu (Shanghai) and Fengli Wang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a real-time spectrum testing device for a volatile condensable material in a wide temperature range and a spectrum testing method by using the device. The device includes a testing module, a vacuum module, a temperature control modul...