US Patent Issued to Shanghai Institute of Technical Physics, Chinese Academy of Sciences on Jan. 13 for "Short-wave infrared spectrum detector and preparation method thereof" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,527,105, issued on Jan. 13, was assigned to Shanghai Institute of Technical Physics, Chinese Academy of Sciences (Shanghai).

"Short-wave infrared spectrum detector and preparation method thereof" was invented by Shaowei Wang (Shanghai), Zhiyi Xuan (Shanghai), Qingquan Liu (Shanghai) and Wei Lu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a short-wave infrared spectrum detector, including: a photosensitive chip, including a plurality of detection pixels; a substrate; and a wavelength division component array, including a plurality of wavelength division pixels, each of the plurality of wavelength division pixels corresponding to ...