US Patent Issued to Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences on July 29 for "Device and method for phase imaging and element detection based on wavefront modulation" (Chinese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,414, issued on July 29, was assigned to Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences (Shanghai).

"Device and method for phase imaging and element detection based on wavefront modulation" was invented by Xingchen Pan (Shanghai), Cheng Liu (Shanghai) and Jianqiang Zhu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device and method for phase imaging and element detection based on wavefront modulation are provided to overcome the disadvantages of an existing interferometry such as twin image elimination, limit resolution, under-sampling wavefront measurement, and multi-modal measurement. From the perspective ...